Secondary ionization: Difference between revisions
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|def=Process in which [[ion]]s are ejected from a sample surface as a result of bombardment by a primary beam of atoms or ions. | |def=Process in which [[ion]]s are ejected from a sample surface as a result of bombardment by a primary beam of atoms or ions. | ||
|rel=[[secondary ion mass spectrometry]] ([[SIMS]]) | |rel=[[secondary ion mass spectrometry]] ([[SIMS]]) | ||
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Latest revision as of 12:51, 8 January 2014
IUPAC RECOMMENDATIONS 2013 |
Secondary ionization |
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Process in which ions are ejected from a sample surface as a result of bombardment by a primary beam of atoms or ions. |
Related Term(s): secondary ion mass spectrometry (SIMS) |
Reference(s):
IUPAC. Compendium of Chemical Terminology, 2nd ed. (the Gold Book). Compiled by A. D. McNaught and A.Wilkinson. Blackwell Scientific Publications, Oxford (1997). XML on-line corrected version: http://goldbook.iupac.org (2006-) created by M. Nic, J. Jirat, B. Kosata; updates compiled by A. Jenkins. |
From Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013. |
Gold Book
GOLD BOOK DEFINITION
IUPAC. Compendium of Chemical Terminology, 2nd ed. (the Gold Book). Compiled by A. D. McNaught and A.Wilkinson. Blackwell Scientific Publications, Oxford (1997). |
Secondary ionization |
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http://goldbook.iupac.org/S05522.html The process in which ions are ejected from a sample surface (which may be a solid or substrate dissolved in a solvent matrix) as a result of bombardment by a primary beam of atoms or ions. Source: PAC, 1991, 63, 1541 (Recommendations for nomenclature and symbolism for mass spectroscopy (including an appendix of terms used in vacuum technology). (Recommendations 1991)) on page 1548 |
IUPAC Gold Book |
Index of Gold Book Terms |