Secondary neutral mass spectrometry: Difference between revisions
From Mass Spec Terms
Created page with '{{Final |acronym=(SNMS) |def=Mass spectrometry technique in which neutral species ejected from a sample surface as a result of bombardment by a primary beam of atoms or […' |
No edit summary |
||
| Line 3: | Line 3: | ||
|def=[[Mass spectrometry]] technique in which neutral species ejected from a sample surface as a result of bombardment by a primary beam of atoms or [[ion]]s are ionized, most often by [[photoionization]], prior to analysis. | |def=[[Mass spectrometry]] technique in which neutral species ejected from a sample surface as a result of bombardment by a primary beam of atoms or [[ion]]s are ionized, most often by [[photoionization]], prior to analysis. | ||
|rel=[[secondary ion mass spectrometry]] ([[SIMS]]) | |rel=[[secondary ion mass spectrometry]] ([[SIMS]]) | ||
|ref= | |ref=H. Oechsner, W. Gerhard. Phys. Lett. A 40, 211 (1972). (http://dx.doi.org/10.1016/0375-9601(72)90660-3 ) | ||
D. Lipinsky, R. Jede, O. Ganschow, A. Benninghoven. J. Vac. Sci. Technol. 3, 2007 (1985). | |||
}} | }} | ||
Latest revision as of 13:11, 8 January 2014
| IUPAC RECOMMENDATIONS 2013 |
| Secondary neutral mass spectrometry (SNMS) |
|---|
| Mass spectrometry technique in which neutral species ejected from a sample surface as a result of bombardment by a primary beam of atoms or ions are ionized, most often by photoionization, prior to analysis. |
| Related Term(s): secondary ion mass spectrometry (SIMS) |
| Reference(s):
H. Oechsner, W. Gerhard. Phys. Lett. A 40, 211 (1972). (http://dx.doi.org/10.1016/0375-9601(72)90660-3 ) D. Lipinsky, R. Jede, O. Ganschow, A. Benninghoven. J. Vac. Sci. Technol. 3, 2007 (1985). |
| From Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013. |
