Fixed product ion scan: Difference between revisions
From Mass Spec Terms
for John Langley |
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== Related Terms == | == Related Terms == | ||
[[Accelerating Voltage Scan]] | *[[Accelerating Voltage Scan]] | ||
[[Fixed Neutral Loss (Gain) Scan]] | *[[Fixed Neutral Loss (Gain) Scan]] | ||
[[Fixed Precursor Ion Scan]] | *[[Fixed Precursor Ion Scan]] | ||
[[Category:Sequential m/z Separation]] | [[Category:Sequential m/z Separation]] | ||
Revision as of 18:01, 1 December 2005
| DRAFT DEFINITION |
| Fixed product ion scan |
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For sector instruments: (a) high voltage scan, or (b) linked scan at constant B2/E ?????????????????????????? Both (a) and (b) give a spectrum of all precursor ions that fragment to yield a pre-selected product ion. |
| Considered between 2004 and 2006 but not included in the 2006 PAC submission |
| This is an unofficial draft definition presented for information and comment. |
Orange Book Entry
A scan that determines, in a single experiment, all the parent ion mass/charge ratios that react to produce a selected daughter ion mass/charge ratio.
