Ion microscopy: Difference between revisions
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== [[Gold Book]] Entry == | == [[Gold Book]] Entry == | ||
Use of the [[secondary ion mass spectrometry]] ([[SIMS]]) technique to obtain micrographs of the elemental (or isotopic) distribution at the surface of a sample with a spatial resolution of 2 ??????????????m or better. | Use of the [[Secondary Ion Mass Spectrometry|secondary ion mass spectrometry]] ([[SIMS]]) technique to obtain micrographs of the elemental (or isotopic) distribution at the surface of a sample with a spatial resolution of 2 ??????????????m or better. | ||
== Related Terms == | == Related Terms == | ||
Revision as of 22:56, 22 January 2005
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Gold Book Entry
Use of the secondary ion mass spectrometry (SIMS) technique to obtain micrographs of the elemental (or isotopic) distribution at the surface of a sample with a spatial resolution of 2 ??????????????m or better.
